Using user-defined fit statistic to analyze two tier items in mathematics

Hak Ping TAM, Margaret WU, Ching Heung LAU, Magdalena Mo Ching MOK

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

The two-tier item is a relatively new item format and is gradually gaining popularity in some areas of educational research. In science education, a typical two-tier item is made up of two portions. The purpose of the first portion is to assess whether students could identify the correct concept with respect to the information stated in the item stem, while the second examines the reason they supplied to justify the option they chose in the first portion. Since the data thus collected are related in a certain way, they pose challenges regarding how analysis should be done to capture the relationship that exists between the two tiers. This chapter attempts to analyze such data by using a user-defined fit statistic within the Rasch approach. The kind of information that can be gathered will be illustrated by way of analyzing a data set in mathematics. Copyright © 2013 Springer Science+Business Media Dordrecht.
Original languageEnglish
Title of host publicationSelf-directed learning oriented assessments in the Asia-Pacific
EditorsMagdalena Mo Ching MOK
Place of PublicationDordrecht, The Netherlands
PublisherSpringer
Pages223-234
ISBN (Electronic)9789400745070
ISBN (Print)9789400745063
DOIs
Publication statusPublished - 2013

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Citation

Tam, H. P., Wu, M., Lau, D. C. H., & Mok, M. M. C. (2013). Using user-defined fit statistic to analyze two tier items in mathematics. In M. M. C. Mok (Ed.), Self-directed learning oriented assessments in the Asia-Pacific (pp. 223-234). Dordrecht, The Netherlands: Springer.

Keywords

  • Word problems
  • Subject matter expertm
  • Partial credit
  • Data analyst
  • Item pair