Using user-defined fit statistic to analyze two-tier items in mathematics

Hak Ping TAM; Magdalena Mo Ching MOK; Ching Heung LAU; Margaret WU

Using user-defined fit statistic to analyze two-tier items in mathematics

Hak Ping TAM, Magdalena Mo Ching MOK, Ching Heung LAU, Margaret WU

Research output: Contribution to conference › Papers

Original language	English
Publication status	Published - Jul 2010
Event	The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy - The Chinese University of Hong Kong, Hong Kong Duration: 19 Jul 2010 → 21 Jul 2010

Conference

Conference	The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy
Country/Territory	Hong Kong
Period	19/07/10 → 21/07/10

Citation

Tam, H.-P., Mok, M. M. C., Lau, D. C. H., & Wu, M. (2010, July). Using user-defined fit statistic to analyze two-tier items in mathematics. In M. M. C. Mok & W. C. Wang (Chair), Scale development using Rasch models. Symposium conducted at the 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy, The Chinese University of Hong Kong, China.