Using user-defined fit statistic to analyze two-tier items in mathematics

Hak Ping TAM, Magdalena Mo Ching MOK, Ching Heung LAU, Margaret WU

Research output: Contribution to conferencePapers

Original languageEnglish
Publication statusPublished - Jul 2010
EventThe 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy - The Chinese University of Hong Kong, Hong Kong
Duration: 19 Jul 201021 Jul 2010

Conference

ConferenceThe 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy
Country/TerritoryHong Kong
Period19/07/1021/07/10

Citation

Tam, H.-P., Mok, M. M. C., Lau, D. C. H., & Wu, M. (2010, July). Using user-defined fit statistic to analyze two-tier items in mathematics. In M. M. C. Mok & W. C. Wang (Chair), Scale development using Rasch models. Symposium conducted at the 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy, The Chinese University of Hong Kong, China.