|Publication status||Published - Jul 2010|
Tam, H.-P., Mok, M. M. C., Lau, D. C. H., & Wu, M. (2010, July). Using user-defined fit statistic to analyze two-tier items in mathematics. In M. M. C. Mok & W. C. Wang (Chair), Scale development using Rasch models. Symposium conducted at the 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy, The Chinese University of Hong Kong, China.