Response function of NaI(Tl) detectors and multiple backscattering of gamma rays in aluminium

Arvind D. SABHARWAL, Manpreet SINGH, Bhajan SINGH, B.S. SANDHU

Research output: Contribution to journalArticlespeer-review

23 Citations (Scopus)

Abstract

The response function, converting the observed pulse-height distribution of a NaI(Tl) detector to a true photon spectrum, is obtained experimentally with the help of an inverse matrix approach. The energy of gamma-ray photons continuously decreases as the number of scatterings increases in a sample having finite dimensions when one deals with the depth of the sample. The present experiments are undertaken to study the effect of target thickness on intensity distribution of gamma photons multiply backscattered from an aluminium target. A NaI(Tl) gamma-ray detector detects the photons backscattered from the aluminium target. The subtraction of analytically estimated singly scattered distribution from the observed intensity distribution (originating from interactions of primary gamma-ray photons with the target) results in multiply backscattered events. We observe that for each incident gamma photon energy, the number of multiply backscattered photons increases with increase in target thickness and then saturates at a particular target thickness called the saturation thickness (depth). Saturation thickness for multiply backscattering of gamma photons is found to decrease with increase in energy of incident gamma-ray photons. Copyright © 2008 Elsevier Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)1467-1473
JournalApplied Radiation and Isotopes
Volume66
Issue number10
Early online dateMar 2008
DOIs
Publication statusPublished - Oct 2008

Citation

Sabharwal, A. D., Singh, M., Singh, B., & Sandhu, B. S. (2008). Response function of NaI(Tl) detectors and multiple backscattering of gamma rays in aluminium. Applied Radiation and Isotopes, 66(10), 1467-1473. doi: 10.1016/j.apradiso.2008.03.006

Keywords

  • Response function
  • Multiple scattering
  • Intensity distribution
  • Backscattered inelastic peak
  • Saturation thickness (depth)

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