Rejection versus error in a multiple experts environment

Suk Wah Louisa LAM, Ching Y. SUEN

Research output: Chapter in Book/Report/Conference proceedingChapters

Abstract

The combination of classifiers has become a very active research area in recent years, and many results have been obtained through various methods. This paper presents some of our theoretical and experimental work in this domain. Copyright © 1998 Springer-Verlag.
Original languageEnglish
Title of host publicationAdvances in pattern recognition
EditorsAdnan AMIN, Dov DORI, Pavel PUDIL, Herbert FREEMAN
Place of PublicationBerlin
PublisherSpringer-Verlag
Pages746-755
ISBN (Electronic)9783540685265
ISBN (Print)9783540648581
DOIs
Publication statusPublished - 1998

Citation

Lam, L., & Suen, C. Y. (1998). Rejection versus error in a multiple experts environment. In A. Amin, D. Dori, P. Pudil, & H. Freeman (Eds.), Advances in pattern recognition (pp. 746-755). Berlin: Springer-Verlag.

Keywords

  • Recognition rate
  • Majority vote
  • Rejection rate
  • Probabilistic neural network
  • Optical character recognition

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