Random-effects gamma process model for accelerated destructive degradation testing data

Man Ho Alpha LING, Suk Joo BAE

Research output: Chapter in Book/Report/Conference proceedingChapters

Abstract

An accelerated degradation test (ADT) accelerates degradation mechanisms of products by loading higher stresses than normal use conditions to shorten testing time. In some situations, degradation levels during ADT can be measured only by destructive inspection where testing units must be destroyed or physical characteristics are significantly changed after measuring the performance degradation. For such an accelerated destructive degradation test (ADDT), initial degradation levels of products are randomly varied individually. To describe individual variation, we propose a random-effect gamma process model with random initial degradation for reliability analysis of ADDT data. Under the proposed modeling framework, we derive the maximum likelihood estimates (MLEs) of the model parameters and construct an inferential procedure for the parameters and reliability measures of interest, using asymptotic properties of the MLEs. In particular, the mean and the variance of the mean-time-to-failure of the products from the ADDT data are explicitly derived in closed forms. Finally, reliability estimation at a normal use condition and inferential procedures are illustrated via an ADDT example of return-springs in a bi-functional DC motor system of an automobile. Copyright © 2025 The Author(s), under exclusive license to Springer Nature Switzerland AG.

Original languageEnglish
Title of host publicationReliability analysis and maintenance optimization of complex systems: Essays in Honor of Professor Won Young Yun on his 65th birthday
EditorsQian Qian ZHAO, Il Han CHUNG, Junjun ZHENG, Jongwoon KIM
Place of PublicationCham
PublisherSpringer
Pages315-328
ISBN (Electronic)9783031702884
ISBN (Print)9783031702877
DOIs
Publication statusPublished - 2025

Citation

Ling, M. H., & Bae, S. J. (2025). Random-effects gamma process model for accelerated destructive degradation testing data. In Q. Q. Zhao, I. H. Chung, J. Zheng, & J. Kim (Eds.), Reliability analysis and maintenance optimization of complex systems: Essays in Honor of Professor Won Young Yun on his 65th birthday (pp. 315-328). Springer. https://doi.org/10.1007/978-3-031-70288-4_17

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