Abstract
We tested measurement invariance for the Short Almost Perfect Scale between Hong Kong (N=272) and American (N=351) 6th graders. Results supported metric invariance for indicators of both Standards (perfectionistic strivings) and Discrepancy (perfectionistic concerns). Additional analyses evaluated different response options for the scales and associations with two Grit factors. Copyright © 2018 Association for Psychological Science.
| Original language | English |
|---|---|
| Publication status | Published - May 2018 |
| Event | 30th Annual Convention of the Association for Psychological Science - San Francisco, United States Duration: 24 May 2018 → 27 May 2018 https://www.psychologicalscience.org/conventions/archive |
Conference
| Conference | 30th Annual Convention of the Association for Psychological Science |
|---|---|
| Abbreviated title | APS 2018 |
| Country/Territory | United States |
| City | San Francisco |
| Period | 24/05/18 → 27/05/18 |
| Internet address |
Citation
Hong, J., Fong, W. T. R., Gilman, R., & Rice, K. G. (2018, May). Perfectionism in Hong Kong and American children. Poster presented at the 30th APS Annual Convention, Hilton San Francisco Union Square, San Francisco, USA.Keywords
- Personality