Keyphrases
One-shot Devices
100%
Weibull Distribution
100%
Simple Steps
100%
Step-stress Accelerated Degradation Test (SSADT)
100%
Sample Allocation
100%
Log-likelihood Ratio
66%
Simulation Study
33%
Exposure Distribution
33%
Stress Level
33%
Stress-driven
33%
Mission Time
33%
Exponential Distribution
33%
Weibull
33%
Inspection Interval
33%
Asymptotic Variance
33%
Termination Time
33%
Information Matrix
33%
Variance Estimation
33%
Flexible Model
33%
Cumulative Exposure
33%
Likelihood Asymptotics
33%
Asymptotic Covariance Matrix
33%
Mathematics
Life Test
100%
Weibull Distribution
100%
Simple Step
100%
Optimal Design
100%
Simulation Study
33%
Exponential Distribution
33%
Stress Level
33%
Asymptotic Variance
33%
Information Matrix
33%
Log Likelihood Function
33%
Asymptotic Covariance Matrix
33%