One-shot device test data have attracted increased attention. The working condition of a one-shot device is unknown until testing the device. In this paper, we consider one-shot device test data with defects that are induced in a realistic manufacturing process. The maximum likelihood approach is proposed for estimating the mean-time-to-failure. In this study, masked data are also considered when we cannot distinguish whether a failed device is originally defective or not. A Monte Carlo simulation study is conducted to evaluate the impacts of the masking effect on the estimation under different settings. Some practical guidelines and recommendations are provided. Copyright © 2022 Taylor & Francis Group, LLC.
CitationShang, X., Ng, H. K. T., & Ling, M. H. (2023). On reliability analysis of one-shot devices with manufacturing defects. Quality Engineering, 35(1), 79-94. doi: 10.1080/08982112.2022.2089855
- Gamma distribution
- Maximum likelihood estimators
- One-shot device
- Weibull distribution