Misspecification of copula for one-shot devices under constant stress accelerated life-tests

Deepak PRAJAPATI, Man Ho Alpha LING, Ping Shing CHAN, Debasis KUNDU

Research output: Contribution to journalArticlespeer-review

4 Citations (Scopus)

Abstract

Copula models have attracted significant attention in the recent literature for modeling multivariate observations. An essential feature of copulas is that they enable us to specify the univariate marginal distributions and their joint behaviors separately. This paper provides asymptotic results for misspecification of copula models, and examines the consequences and detection of misspecification in copula models under constant-stress accelerated life-tests for one-shot devices. The one-shot device is considered as a two-component system. The reliability is an important factor in lifetime data applications, and we focus on the effect of misspecification on the estimation of the reliability of one-shot devices. Moreover, the Akaike information criterion is used as a specification test for copula model validation. A simulation study is carried out to evaluate the effect of misspecification under the Gumbel-Hougaard, the Frank and the Clayton copulas incorporated with Weibull and gamma distributions as marginal distributions, in terms of asymptotic bias, asymptotic relative bias, and root mean square error. Copyright © 2022 IMechE.
Original languageEnglish
Pages (from-to)725-740
Journal Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability
Volume237
Issue number4
Early online dateJul 2022
DOIs
Publication statusPublished - Aug 2023

Citation

Prajapati, D., Ling, M. H., Chan, P. S., & Kundu, D. (2023). Misspecification of copula for one-shot devices under constant stress accelerated life-tests. Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability, 237(4), 725-740. https://doi.org/10.1177/1748006X221108850

Keywords

  • Copula
  • Constant-stress accelerated life testing
  • One-shot devices
  • Quasi-maximum likelihood estimator
  • Series and parallel systems

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