Joint learning system based on semi–pseudo–label reliability assessment for weak–fault diagnosis with few labels

Da-wei GAO, Yong-sheng ZHU, Ke YAN, Hong FU, Zhi-jun REN, Wei KANG, C. Guedes SOARES

Research output: Contribution to journalArticlespeer-review

15 Citations (Scopus)

Abstract

Deep neural networks exhibit excellent performance in fault feature extraction for considerable amounts of data. However, data labeling is a difficult task in practical engineering, which may lead to problems in fault diagnosis particularly when faults are weak. To resolve the foregoing, a semi–pseudo–labeling diagnosis system is proposed in this paper. The proposed system considers the confidence and reliability of samples to cope with situations where labels are insufficient and faults are weak. By adding pseudo–labels, unlabeled data whose fault information is swamped by a large amount of noise can achieve low–density separation and entropy regularization in the sample space. Consequently, the training of deep learning models for weak–fault diagnosis is supported. Regarding the traditional pseudo–labeling problems in weak–fault–related feature extraction, a series of solutions has been proposed to solve the problems in the field of fault diagnosis. The designed model reduces pseudo–label noise and enhances the capability of weak–fault–related feature extraction. The effectiveness of this method was validated on the datasets collected by simulating faulty bearings and those sustaining actual failure. Copyright © 2022 Elsevier Ltd.
Original languageEnglish
Article number110089
JournalMechanical Systems and Signal Processing
Volume189
Early online date04 Jan 2023
DOIs
Publication statusPublished - 15 Apr 2023

Citation

Gao, D.-W., Zhu, Y.-S., Yan, K., Fu, H., Ren, Z.-J., Kang, W., & Soares, C. G. (2023). Joint learning system based on semi–pseudo–label reliability assessment for weak–fault diagnosis with few labels. Mechanical Systems and Signal Processing, 189. Retrieved from https://doi.org/10.1016/j.ymssp.2022.110089

Keywords

  • Pseudo–label
  • Semi–supervised learning
  • Weak–fault diagnosis
  • Sample reliability
  • Label noise

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