Item response models for carry-over effect in parallel-design tests

Kuan Yu JIN; Wen Chung WANG

Item response models for carry-over effect in parallel-design tests

Kuan Yu JIN
, Wen Chung WANG

Department of Psychology (PS)

Research output: Contribution to conference › Papers

Abstract

The parallel design is commonly used in survey or inventories. Standard IRT models fail to account for carry-over effect across scales. We thus created a new of IRT model and conducted simulations to evaluate parameter recovery and consequences of model misspecification. An empirical example of school bullying is given.

Original language	English
Publication status	Published - Apr 2014
Event	2014 Annual Meeting of National Council on Measurement in Education - Philadelphia, United States Duration: 04 Apr 2014 → 06 Apr 2014

Conference

Conference	2014 Annual Meeting of National Council on Measurement in Education
Abbreviated title	NCME 2014
Country/Territory	United States
City	Philadelphia
Period	04/04/14 → 06/04/14

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abstract = "The parallel design is commonly used in survey or inventories. Standard IRT models fail to account for carry-over effect across scales. We thus created a new of IRT model and conducted simulations to evaluate parameter recovery and consequences of model misspecification. An empirical example of school bullying is given.",

author = "JIN, \{Kuan Yu\} and WANG, \{Wen Chung\}",

year = "2014",

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language = "English",

note = "2014 Annual Meeting of National Council on Measurement in Education, NCME 2014 ; Conference date: 04-04-2014 Through 06-04-2014",

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T1 - Item response models for carry-over effect in parallel-design tests

AU - JIN, Kuan Yu

AU - WANG, Wen Chung

PY - 2014/4

Y1 - 2014/4

N2 - The parallel design is commonly used in survey or inventories. Standard IRT models fail to account for carry-over effect across scales. We thus created a new of IRT model and conducted simulations to evaluate parameter recovery and consequences of model misspecification. An empirical example of school bullying is given.

AB - The parallel design is commonly used in survey or inventories. Standard IRT models fail to account for carry-over effect across scales. We thus created a new of IRT model and conducted simulations to evaluate parameter recovery and consequences of model misspecification. An empirical example of school bullying is given.

M3 - Papers

T2 - 2014 Annual Meeting of National Council on Measurement in Education

Y2 - 4 April 2014 through 6 April 2014

ER -

Item response models for carry-over effect in parallel-design tests

Abstract

Conference

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