Item response models for carry-over effect in parallel-design tests

Kuan Yu JIN, Wen Chung WANG

Research output: Contribution to conferencePapers

Abstract

The parallel design is commonly used in survey or inventories. Standard IRT models fail to account for carry-over effect across scales. We thus created a new of IRT model and conducted simulations to evaluate parameter recovery and consequences of model misspecification. An empirical example of school bullying is given.
Original languageEnglish
Publication statusPublished - Apr 2014

Citation

Jin, K. Y., & Wang, W. C. (2014, April). Item response models for carry-over effect in parallel-design tests. Paper presented at the annual meeting of National Council on Measurement in Education, Philadelphia, PA.

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