Keyphrases
One-shot Devices
100%
Gamma Frailty
100%
Failure Mode
60%
Device Testing
40%
Maximum Likelihood Estimation
40%
Inferential Method
40%
Monte Carlo Simulation
20%
Confidence Interval
20%
Mean Lifetime
20%
Expectation-maximization Algorithm
20%
Exponential Lifetime
20%
Normal Operating Conditions
20%
Partially Accelerated Life Test
20%
Manufacturing Process
20%
Intended Function
20%
Lifetime Distribution
20%
Right Censoring
20%
Left-censored
20%
Dependent Components
20%
Latent Dependence
20%
Manufacturing Assembly
20%
Multiple Components
20%
Multiple Failure Modes
20%
Latent Heterogeneity
20%
Mouse Data
20%
Engineering
Failure Mode
100%
Maximum Likelihood Estimate
50%
Test Data
25%
Model Parameter
25%
Illustrates
25%
Accelerated Life Test
25%
Confidence Interval
25%
Manufacturing Process
25%
Constant Stress
25%
Normal Operating Condition
25%
Simulated Data
25%
Mathematics
Failure Mode
100%
Maximum Likelihood Estimate
50%
Test Data
25%
Confidence Interval
25%
Monte Carlo
25%
Life Test
25%
Lifetime Distribution
25%
Simulated Data
25%