Inference for one-shot devices with dependent k-out-of-M structured components under gamma frailty

Keyphrases

• One-shot Devices 100%
• Gamma Frailty 100%
• Failure Mode 60%
• Device Testing 40%
• Maximum Likelihood Estimation 40%
• Inferential Method 40%
• Monte Carlo Simulation 20%
• Confidence Interval 20%
• Mean Lifetime 20%
• Expectation-maximization Algorithm 20%
• Exponential Lifetime 20%
• Normal Operating Conditions 20%
• Partially Accelerated Life Test 20%
• Manufacturing Process 20%
• Intended Function 20%
• Lifetime Distribution 20%
• Right Censoring 20%
• Left-censored 20%
• Dependent Components 20%
• Latent Dependence 20%
• Manufacturing Assembly 20%
• Multiple Components 20%
• Multiple Failure Modes 20%
• Latent Heterogeneity 20%
• Mouse Data 20%

Engineering

• Failure Mode 100%
• Maximum Likelihood Estimate 50%
• Test Data 25%
• Model Parameter 25%
• Illustrates 25%
• Accelerated Life Test 25%
• Confidence Interval 25%
• Manufacturing Process 25%
• Constant Stress 25%
• Normal Operating Condition 25%
• Simulated Data 25%

Mathematics

• Failure Mode 100%
• Maximum Likelihood Estimate 50%
• Test Data 25%
• Confidence Interval 25%
• Monte Carlo 25%
• Life Test 25%
• Lifetime Distribution 25%
• Simulated Data 25%