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Higher order testlet response models for hierarchical latent traits and testlet-based items
Hung-Yu HUANG, Wen Chung WANG
Department of Psychology (PS)
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peer-review
17
Citations (Scopus)
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Keyphrases
Testlet
100%
Latent Trait
100%
High-order
100%
Testlet Response Model
100%
Copyright
25%
Fit Statistics
25%
Freeware
25%
Test Reliability
25%
Ability Test
25%
Parameter Recovery
25%
First-order
25%
Item Parameter
25%
WinBUGS
25%
Psychological Measurement
25%
Factor Loadings
25%
Educational Measurement
25%
Parameter Estimation
25%
Biased Estimation
25%
Model Effectiveness
25%
Deviance Information Criterion
25%
Testlet Effect
25%
Model Comparison
25%
Local Item Dependence
25%
Model Misspecification
25%
Bayesian Approach
25%
High Dimension
25%
Fit Assessment
25%
Posterior Predictive Checks
25%
Psychology
Latent Trait
100%
Misspecification
25%