Experimental investigation of saturation depth of 0.662 MeV gamma rays in copper

Gurvinderjit SINGH, Manpreet SINGH, B. S. SANDHU, Bhajan SINGH

Research output: Contribution to journalArticlespeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)111-115
JournalIndian Journal of Pure & Applied Physics
Volume45
Publication statusPublished - Feb 2007

Citation

Singh, G., Singh, M., Sandhu, B. S., & Singh, B. (2007). Experimental investigation of saturation depth of 0.662 MeV gamma rays in copper. Indian Journal of Pure & Applied Physics, 45, 111-115.

Keywords

  • Compton scattered events
  • Saturation thickness
  • Signal-to-noise ratio