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EM algorithm for one-shot device testing with competing risks under Weibull distribution
Narayanaswamy BALAKRISHNAN
, Hon Yiu SO
,
Man Ho Alpha LING
Department of Mathematics and Information Technology (MIT)
Research output
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Contribution to journal
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Articles
›
peer-review
36
Citations (Scopus)
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Dive into the research topics of 'EM algorithm for one-shot device testing with competing risks under Weibull distribution'. Together they form a unique fingerprint.
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Keyphrases
One-shot Device Testing
100%
Expectation-maximization Algorithm
100%
Competing Risks
100%
Weibull Distribution
100%
Copyright
25%
Testing Analysis
25%
Scoring Method
25%
Monte Carlo Simulation Study
25%
Risk Model
25%
Fisher Scoring
25%
Insulation
25%
Model Parameter Estimation
25%
Mathematics
Competing Risk
100%
Expectation-Maximization Algorithm
100%
Weibull Distribution
100%
Simulation Study
25%
Monte Carlo
25%
Balakrishnan
25%
Competing Risk Model
25%
Engineering
Expectation Maximization Algorithm
100%
Model Parameter
25%
Risk Model
25%
Balakrishnan
25%