EM algorithm for one-shot device testing with competing risks under Weibull distribution

Narayanaswamy BALAKRISHNAN, Hon Yiu SO, Man Ho Alpha LING

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

This paper provides an extension of the work of Balakrishnan and Ling by introducing a competing risks model into a one-shot device testing analysis under an ALT setting. An expectation maximization (EM) algorithm is then developed for the estimation of model parameters. An extensive Monte Carlo simulation study is carried out to assess the performance of the proposed method. The performance of the EM algorithm and the Fisher scoring method are also compared. Finally, the proposed EM algorithm is applied to a modified Class-B insulation data for illustrating the results developed here. Copyright © 2015 IEEE.
Original languageEnglish
Pages (from-to)973-991
JournalIEEE Transactions on Reliability
Volume65
Issue number2
Early online dateDec 2015
DOIs
Publication statusPublished - 2016

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Weibull distribution
Testing
Insulation

Citation

Balakrishnan, N., So, H. Y., & Ling, M. H. (2016). EM algorithm for one-shot device testing with competing risks under Weibull distribution. IEEE Transactions on Reliability, 65(2), 973-991.

Keywords

  • Class-B insulation data
  • EM algorithm
  • Weibull distribution
  • Competing risks
  • Inequality constrained least-squares
  • Masked data
  • One-shot device