EM algorithm for one-shot device testing under the exponential distribution

Keyphrases

• Accelerated Life Test 20%
• Algorithm Method 20%
• Bayesian Approach 60%
• Binary Data 40%
• Copyright 20%
• Design Product 20%
• Device Testing 20%
• EM Algorithm 100%
• Exponential Distribution 100%
• Good for 40%
• Highly Reliable 20%
• Highly Reliable Products 20%
• Lifetime Distribution 20%
• Long Lifetime 20%
• Manufacturing Design 20%
• Manufacturing Technology 20%
• Maximum Likelihood Estimation 20%
• Maximum Likelihood Estimator 20%
• Normal Prior 20%
• One-shot Device Testing 100%
• One-shot Devices 20%
• Simulation Study 20%
• Technology Products 20%

Mathematics

• Actual Observation 20%
• Bayesian Approach 60%
• Binary Data 40%
• Closed Form 20%
• EM Algorithm 100%
• Exponential Distribution 100%
• Life Test 20%
• Lifetime Distribution 20%
• Maximum Likelihood Estimate 20%
• Maximum Likelihood Estimator 20%
• Simulation Study 20%

Computer Science

• Bayesian Approach 100%
• Device under Test 33%
• Exponential Distribution 100%
• Likelihood Estimate 33%
• maximum-likelihood 66%
• Simulation Study 33%
• Technology Product 33%