| Conference | The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy |
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| Country/Territory | China |
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| City | Hong Kong |
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| Period | 19/07/10 → 21/07/10 |
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Lee, Y. P. A. (2010, July). Development of a vertical EFL ability scale for Hong Kong: Calibration and test invariance issues. In M. M. C. Mok & W. C. Wang (Chair), Scale development using Rasch models. Symposium conducted at the 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy, The Chinese University of Hong Kong, China.