In reliability analysis, accelerated life-tests are commonly used for inducing rapid failures, thus producing more lifetime information in a relatively short period of time. A link function relating stress levels and lifetimes is then utilized to extrapolate lifetimes of units from accelerated conditions to normal operating conditions. In the context of one-shot device testing, encountered commonly in testing devices such as munitions, rockets, and automobile air bags, either left- or right-censored data are collected instead of actual lifetimes of the devices under test. In this chapter, we study binary response data of one-shot devices collected from constant-stress accelerated life-tests, and discuss the analysis of such one-shot device testing data under accelerated life-tests based on parametric and semi-parametric models. In addition, a competing risks model is introduced into the one-shot device testing analysis under constant-stress accelerated life-test setting. Finally, some numerical examples are presented to illustrate the models and inferential results discussed here. Copyright © 2016 Springer International Publishing Switzerland.
|Title of host publication
|Principles of performance and reliability modeling and evaluation: Essays in honor of Kishore Trivedi on his 70th birthday
|Lance FIONDELLA , Antonio PULIAFITO
|Place of Publication
|Springer International Publishing
|Published - 2016