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Considerations in Developing Vertical Scales Using IRT

  • Magdalena Mo Ching MOK
  • , Zi YAN
  • , D. C. H. LAU

Research output: Contribution to conferencePapers

Original languageEnglish
Publication statusPublished - Jul 2010
EventThe 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy - The Chinese University of Hong Kong, Hong Kong, China
Duration: 19 Jul 201021 Jul 2010

Conference

ConferenceThe 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy
Country/TerritoryHong Kong, China
Period19/07/1021/07/10