Considerations in developing vertical scales using IRT: Link methods, link items and sample size issues

Magdalena Mo Ching MOK; Zi YAN; Ching Heung LAU

Considerations in developing vertical scales using IRT: Link methods, link items and sample size issues

Magdalena Mo Ching MOK
, Zi YAN
, Ching Heung LAU

Department of Psychology (PS)

Research output: Contribution to conference › Papers

Original language	English
Publication status	Published - 2010
Event	The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy - The Chinese University of Hong Kong, Hong Kong, China Duration: 19 Jul 2010 → 21 Jul 2010

Conference

Conference	The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy
Country/Territory	Hong Kong, China
Period	19/07/10 → 21/07/10

Considerations in developing vertical scales using IRT: Link methods, link items and sample size issues. / MOK, Magdalena Mo Ching; YAN, Zi; LAU, Ching Heung.
2010. Paper presented at The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy, Hong Kong, China.

Research output: Contribution to conference › Papers

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title = "Considerations in developing vertical scales using IRT: Link methods, link items and sample size issues",

author = "MOK, \{Magdalena Mo Ching\} and Zi YAN and LAU, \{Ching Heung\}",

year = "2010",

language = "English",

note = "The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy ; Conference date: 19-07-2010 Through 21-07-2010",

}

TY - CONF

T1 - Considerations in developing vertical scales using IRT: Link methods, link items and sample size issues

AU - MOK, Magdalena Mo Ching

AU - YAN, Zi

AU - LAU, Ching Heung

PY - 2010

Y1 - 2010

M3 - Papers

T2 - The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy

Y2 - 19 July 2010 through 21 July 2010

ER -