Computerized classification testing under the one-parameter logistic response model with ability-based guessing

Wen Chung WANG, Sheng Yun HUANG

Research output: Contribution to conferencePapers

Original languageEnglish
Publication statusPublished - 2010
Event75th Annual Meeting of the Psychometric Society - The University of Georgia, Athens, United States
Duration: 06 Jul 201009 Jul 2010

Conference

Conference75th Annual Meeting of the Psychometric Society
Country/TerritoryUnited States
CityAthens
Period06/07/1009/07/10

Citation

Wang, W.-C., & Huang, S.-Y. (2010, July). Computerized classification testing under the one-parameter logistic response model with ability-based guessing. Paper presented at the 75th Annual Meeting of the Psychometric Society, Georgia, USA.