Computerized classification testing under the higher-order IRT model

Kung Hsien LEE; Wen Chung WANG

Computerized classification testing under the higher-order IRT model

Kung Hsien LEE
, Wen Chung WANG

Department of Psychology (PS)

Research output: Contribution to conference › Papers

Original language	English
Publication status	Published - 2010
Event	The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy - The Chinese University of Hong Kong, Hong Kong, China Duration: 19 Jul 2010 → 21 Jul 2010

Conference

Conference	The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy
Country/Territory	Hong Kong, China
Period	19/07/10 → 21/07/10

@conference{fae54ab5a9b143768a6221b427218e0a,

title = "Computerized classification testing under the higher-order IRT model",

author = "LEE, \{Kung Hsien\} and WANG, \{Wen Chung\}",

year = "2010",

language = "English",

note = "The 7th Conference of the International Test Commission: Challenges and Opportunities in Testing and Assessment in a Globalized Economy ; Conference date: 19-07-2010 Through 21-07-2010",

}