Angular distribution of 662 keV multiply-Compton scattered gamma rays in copper

Manpreet SINGH, Gurvinderjit SINGH, B. S. SANDHU, Bhajan SINGH

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12 Citations (Scopus)

Abstract

The angular distribution of multiple Compton scattering of 662 keV gamma photons, obtained from six Curie 137Cs source, incident on copper scatterer of varying thickness is studied experimentally in both the forward and backward hemispheres. The scattered photons are detected by a 51 mm × 51 mm NaI(Tl) scintillation detector. The full-energy peak corresponding to singly scattered events is reconstructed analytically. We observe that the numbers of multiply scattered events, having same energy as in the singly scattered distribution, first increases with increase in target thickness and then saturate. The optimum thickness at which the multiply scattered events saturate is determined at different scattering angles. Copyright © 2007 Elsevier Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)420-427
JournalRadiation Measurements
Volume42
Issue number3
Early online dateFeb 2007
DOIs
Publication statusPublished - Mar 2007

Citation

Singh, M., Singh, G., Sandhu, B. S., & Singh, B. (2007). Angular distribution of 662 keV multiply-Compton scattered gamma rays in copper. Radiation Measurements, 42(3), 420-427. doi: 10.1016/j.radmeas.2007.01.037

Keywords

  • Singly and multiply Compton scattered events
  • Angular distribution
  • Saturation depth

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