An overview of models for one-shot device testing data analysis

One-shot devices are a unique class of products designed to function only once and then become unusable or discarded. These specialized devices are found in various industries, such as consumer electronics, aerospace, and military applications. The reliability of one-shot devices is of paramount importance, as they must perform their critical functions correctly the first and only time they are used in emergency or safety-critical situations and their failure can lead to catastrophic consequences. This chapter provides an overview of the latest developments and research contributions in modeling one-shot device testing data. It covers a range of topics, including popular lifetime distribution models, reliability analysis of devices with multiple failure modes, semi-parametric approaches, step-stress accelerated life testing, and manufacturing defects on one-shot devices. By synthesizing the key findings and insights from the recent literature, this chapter aims to open up more potential avenues for future investigations. Copyright © 2025 Published by Elsevier B.V.