An item response model for testlet-based rating scale items

Wen Chung WANG, Xuelan QIU

Research output: Contribution to conferencePapers


A new item response model is developed to account for directly for randomness in the threshold and testlet effects in testlet-based rating scale items, which is referred to as the testlet random-effects rating scale model (TRERSM). It is an extension of the random-effects rating scale model (RERSM; Wang, Wilson, & Shih, 2006). Simulations were conducted to examine parameters recovery under the TRERSM by using ConQuest (Wu, Adams, Wilson, & Haldane, 2007). Results indicated that the parameters could be recovered very accurately. An example was provided to demonstrate the advantages of the TRERSM over the RERSM and the rating scale model (RSM; Andrich, 1978).


Conference2011 Annual Meeting of American Educational Research Association: “Inciting the Social Imagination: Education Research for the Public Good”
Abbreviated titleAERA 2011
Country/TerritoryUnited States
CityNew Orleans
Internet address


Wang, W.-C., & Qiu, X. (2011, April). An item response model for testlet-based rating scale items. Paper presented at the (American Educational Research Association) AERA 2011 Annual Meeting: Inciting the social imagination: Education research for the public good, New Orleans Marriott, New Orleans, Louisiana.


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