Abstract
A new item response model is developed to account for directly for randomness in the threshold and testlet effects in testlet-based rating scale items, which is referred to as the testlet random-effects rating scale model (TRERSM). It is an extension of the random-effects rating scale model (RERSM; Wang, Wilson, & Shih, 2006). Simulations were conducted to examine parameters recovery under the TRERSM by using ConQuest (Wu, Adams, Wilson, & Haldane, 2007). Results indicated that the parameters could be recovered very accurately. An example was provided to demonstrate the advantages of the TRERSM over the RERSM and the rating scale model (RSM; Andrich, 1978).
| Original language | English |
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| Publication status | Published - 2011 |
| Event | 2011 Annual Meeting of American Educational Research Association: “Inciting the Social Imagination: Education Research for the Public Good” - New Orleans, United States Duration: 08 Apr 2011 → 12 Apr 2011 https://www.aera.net/Events-Meetings/Annual-Meeting/Previous-Annual-Meetings/2011-Annual-Meeting |
Conference
| Conference | 2011 Annual Meeting of American Educational Research Association: “Inciting the Social Imagination: Education Research for the Public Good” |
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| Abbreviated title | AERA 2011 |
| Country/Territory | United States |
| City | New Orleans |
| Period | 08/04/11 → 12/04/11 |
| Internet address |