An analysis of one-shot devices with multiple components

Research output: Chapter in Book/Report/Conference proceeding › Chapters

Original language	English
Title of host publication	Developments in reliability engineering
Editors	Mangey RAM
Place of Publication	Amsterdam, Netherlands
Publisher	Elsevier
Pages	523-574
ISBN (Print)	9780443132421
DOIs	https://doi.org/10.1016/B978-0-443-13242-1.00007-2
Publication status	Published - 2024

Access to Document

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title = "An analysis of one-shot devices with multiple components",

author = "LING, \{Man Ho Alpha\}",

year = "2024",

doi = "10.1016/B978-0-443-13242-1.00007-2",

language = "English",

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pages = "523--574",

editor = "Mangey RAM",

booktitle = "Developments in reliability engineering",

publisher = "Elsevier",

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BT - Developments in reliability engineering

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