Original language | English |
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Title of host publication | Developments in reliability engineering |
Editors | Mangey RAM |
Place of Publication | Amsterdam, Netherlands |
Publisher | Elsevier |
Pages | 523-574 |
ISBN (Print) | 9780443132421 |
DOIs | |
Publication status | Published - 2024 |
An analysis of one-shot devices with multiple components
Research output: Chapter in Book/Report/Conference proceeding › Chapters