Accelerated life testing of one-shot devices: Data collection and analysis

Narayanaswamy BALAKRISHNAN, Man Ho Alpha LING, Hon Yiu SO

Research output: Book/ReportBooks

Original languageEnglish
Place of PublicationHoboken, New Jersey
PublisherJohn Wiley & Sons Inc
ISBN (Electronic)9781119664017, 9781119663942
ISBN (Print)9781119664000, 1119664004
Publication statusPublished - 23 Mar 2021

Citation

Balakrishnan, N., Ling, M. H., & So, H. Y. (2021). Accelerated life testing of one-shot devices: Data collection and analysis. Hoboken, New Jersey: John Wiley & Sons Inc.