Accelerated life testing data analyses for one-shot devices

Narayanaswamy BALAKRISHNAN, Man Ho Alpha LING

Research output: Chapter in Book/Report/Conference proceedingChapters


One-shot device testing data arises from devices that can be used only once, for example, fire extinguishers, electro-explosive devices, and airbags in cars. In life tests, only the conditions of the tested devices at a specified time can be observed, instead of their actual lifetimes. Such data is therefore of either left- or right-censored. For these heavily censored data, there is an increasing need to develop innovative techniques for reliability analysis. In this chapter, we provide an overview of analyses of one-shot device testing data collected from accelerated life tests and discuss some statistical issues on the statistical estimation and inference as well as optimal designs of accelerated life tests for one-shot devices. Copyright © 2023 Springer-Verlag London Ltd., part of Springer Nature.

Original languageEnglish
Title of host publicationSpringer handbook of engineering statistics
EditorsHoang PHAM
Place of PublicationLondon
EditionSecond edition
ISBN (Electronic)9781447175032
ISBN (Print)9781447175025
Publication statusPublished - 2023


Balakrishnan, N., & Ling, M. H. (2023). Accelerated life testing data analyses for one-shot devices. In H. Pham (Ed.), Springer handbook of engineering statistics (2nd ed., pp. 1039-1057). London: Springer.


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