Accelerated degradation analysis for the quality of a system based on the gamma process

Man Ho Alpha LING, Kwok Leung TSUI, Narayanaswamy BALAKRISHNAN

Research output: Contribution to journalArticlespeer-review

107 Citations (Scopus)

Abstract

As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed. Copyright © 2014 IEEE.
Original languageEnglish
Pages (from-to)463-472
JournalIEEE Transactions on Reliability
Volume64
Issue number1
Early online dateJul 2014
DOIs
Publication statusPublished - Mar 2015

Citation

Ling, M. H., Tsui, K. L., Balakrishnan, N. (2015). Accelerated degradation analysis for the quality of a system based on the gamma process. IEEE Transactions on Reliability, 64(1), 463-472.

Keywords

  • System health
  • Accelerated degradation analysis
  • Asymptotic confidence interval
  • Gamma process
  • Maximum likelihood estimate
  • Remaining useful life

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