A short form of the Chinese version of the Weinstein Noise Sensitivity Scale through optimal test assembly

Sha LI, Daniel Yee Tak FONG, Lai Yin Sarah WAN, Bradley MCPHERSON, Esther Yuet Ying LAU, Lixi HUANG, Mary Sau Man IP, Janet Yuen Ha WONG

Research output: Contribution to journalArticlespeer-review

Abstract

This study developed a short form of the traditional Chinese version of the Weinstein Noise Sensitivity Scale (WNSS) through optimal test assembly (OTA). A total of 1069 Chinese adults (64.8% female) completed the territory-wide cross-sectional study. We first removed Items 12 and 5 which had negative factor loading and gender-related differential item functioning (DIF), respectively. The optimal length was then determined as the minimal one that reasonably resembled the reliability and validity of the scale without DIF items. OTA identified an 8-item WNSS (WNSS-8) which retained 67.2% of the test information of the original 21-item scale and had a Cronbach’s alpha of 0.83. It also showed significant correlations of 0.272 and −0.115 with the neuroticism and extraversion scales of Chinese NEO-Five Factor Inventory, respectively. Adequate model fit of the WNSS-8 was demonstrated by the confirmatory factor analysis. The Chinese WNSS-8 can be used to assess noise sensitivity without compromising reliability and validity. Copyright © 2021 by the authors. Licensee MDPI, Basel, Switzerland.
Original languageEnglish
Article number879
JournalInternational Journal of Environmental Research and Public Health
Volume18
Issue number3
Early online date20 Jan 2021
DOIs
Publication statusPublished - 01 Feb 2021

Citation

Li, S., Fong, D. Y. T., Wan, S. L. Y., McPherson, B., Lau, E. Y. Y., Huang, L., . . . Wong, J. Y. H. (2021). A short form of the Chinese version of the Weinstein Noise Sensitivity Scale through optimal test assembly. International Journal of Environmental Research and Public Health, 18(3). Retrieved from https://doi.org/10.3390/ijerph18030879

Keywords

  • Item response theory
  • Item selection
  • Noise sensitivity
  • Optimal test assembly
  • Reliability
  • Validity

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