A majority invariant approach to patch robustness certification for deep learning models

Qilin ZHOU, Zhengyuan WEI, Haipeng WANG, W. K. CHAN

Research output: Chapter in Book/Report/Conference proceedingChapters

1 Citation (Scopus)

Abstract

Patch robustness certification ensures no patch within a given bound on a sample can manipulate a deep learning model to predict a different label. However, existing techniques cannot certify samples that cannot meet their strict bars at the classifier level or the patch region level. This paper proposes MajorCert. MajorCert firstly finds all possible label sets manipulatable by the same patch region on the same sample across the underlying classifiers, then enumerates their combinations element-wise, and finally checks whether the majority invariant of all these combinations is intact to certify samples. Copyright © 2023 IEEE.

Original languageEnglish
Title of host publicationProceedings of 2023 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023
Place of PublicationDanvers, MA
PublisherIEEE
Pages1790-1794
ISBN (Electronic)9798350329964
DOIs
Publication statusPublished - 2023

Citation

Zhou, Q., Wei, Z., Wang, H., & Chan, W. K. (2023). A majority invariant approach to patch robustness certification for deep learning models. In Proceedings of 2023 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023 (pp. 1790-1794). IEEE. https://doi.org/10.1109/ASE56229.2023.00137

Keywords

  • Patch robustness
  • Certification
  • Invariant

Fingerprint

Dive into the research topics of 'A majority invariant approach to patch robustness certification for deep learning models'. Together they form a unique fingerprint.