A Bayesian approach for one-shot device testing with exponential lifetimes under competing risks

Narayanaswamy BALAKRISHNAN, Hon Yiu SO, Man Ho Alpha LING

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5 Citations (Scopus)

Abstract

This paper considers a competing risk model for a one-shot device testing analysis under an accelerated life test setting. Due to the consideration of competing risks, the joint posterior distribution becomes quite complicated. The Metropolis-Hastings sampling method is used for the estimation of the posterior means of the variables of interest. A simulation study is carried out to assess the Bayesian approach with different priors, and also to compare it with the EM algorithm for maximum likelihood estimation. Finally, an example from a tumorigenicity experiment is presented. Copyright © 2015 IEEE.
Original languageEnglish
Pages (from-to)469-485
JournalIEEE Transactions on Reliability
Volume65
Issue number1
Early online dateJun 2015
DOIs
Publication statusPublished - 2016

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Citation

Balakrishnan, N., So, H. Y., & Ling, M. H. (2016). A Bayesian approach for one-shot device testing with exponential lifetimes under competing risks. IEEE Transactions on Reliability, 65(1), 469-485.